DocumentCode
1321261
Title
Bias: A Network Analysis Computer Program Useful to the Reliability Engineer
Author
Willows, James L., Jr. ; Magnuson, Waldo G., Jr.
Author_Institution
Lawrence Radiation Laboratory, Livermore, Calif. 94550.
Issue
3
fYear
1971
Firstpage
108
Lastpage
110
Abstract
This paper briefly describes the Bias program1 and its application in reliability analysis. Except in the simplest of networks, the calculation of parameters for reliability analyses is not easily achieved. Because of the easy temperature variation and other features of the network analysis program Bias, it is extremely well suited to at least three commonly used reliability analysis procedures: failure mode and criticality, drift failure, reliability prediction (catastrophic failures).
Keywords
Circuits; Computer network reliability; Computer networks; Failure analysis; Reliability engineering; Resistors; Semiconductor diodes; Temperature dependence; Transistors; Voltage;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1971.5216108
Filename
5216108
Link To Document