• DocumentCode
    1321261
  • Title

    Bias: A Network Analysis Computer Program Useful to the Reliability Engineer

  • Author

    Willows, James L., Jr. ; Magnuson, Waldo G., Jr.

  • Author_Institution
    Lawrence Radiation Laboratory, Livermore, Calif. 94550.
  • Issue
    3
  • fYear
    1971
  • Firstpage
    108
  • Lastpage
    110
  • Abstract
    This paper briefly describes the Bias program1 and its application in reliability analysis. Except in the simplest of networks, the calculation of parameters for reliability analyses is not easily achieved. Because of the easy temperature variation and other features of the network analysis program Bias, it is extremely well suited to at least three commonly used reliability analysis procedures: failure mode and criticality, drift failure, reliability prediction (catastrophic failures).
  • Keywords
    Circuits; Computer network reliability; Computer networks; Failure analysis; Reliability engineering; Resistors; Semiconductor diodes; Temperature dependence; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1971.5216108
  • Filename
    5216108