DocumentCode :
1321424
Title :
Probability Limits for Life Test Data
Author :
Dubey, Satya D.
Author_Institution :
Department of Industrial Engineering and Operations Research, New York University, Bronx, N.Y.
Issue :
4
fYear :
1971
Firstpage :
212
Lastpage :
216
Abstract :
In this paper a general theory for constructing probability limits for life test data is briefly discussed. It is then applied to a set of life test data to determine which of three specified Weibull distributions give the best fit.
Keywords :
Aerospace engineering; Aerospace industry; Gold; Life testing; Probability density function; Random variables; Reliability engineering; Reliability theory; Statistical distributions; Weibull distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1971.5216138
Filename :
5216138
Link To Document :
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