DocumentCode
1321424
Title
Probability Limits for Life Test Data
Author
Dubey, Satya D.
Author_Institution
Department of Industrial Engineering and Operations Research, New York University, Bronx, N.Y.
Issue
4
fYear
1971
Firstpage
212
Lastpage
216
Abstract
In this paper a general theory for constructing probability limits for life test data is briefly discussed. It is then applied to a set of life test data to determine which of three specified Weibull distributions give the best fit.
Keywords
Aerospace engineering; Aerospace industry; Gold; Life testing; Probability density function; Random variables; Reliability engineering; Reliability theory; Statistical distributions; Weibull distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1971.5216138
Filename
5216138
Link To Document