DocumentCode :
1321458
Title :
Product Reliability and Random Fatigue
Author :
Sorensen, Arthur, Jr.
Author_Institution :
College of Applied Science and Engineering, University of Wisconsin-Milwaukee, Milwaukee, Wis.
Issue :
4
fYear :
1971
Firstpage :
244
Lastpage :
248
Abstract :
The fatigue life of a mechanical component in a conventional ional test situation depends upon the stress amplitude. A change in the stress amplitude during a laboratory test-program involves a consideration of the damage produced by each stress cycle imposed upon the test specimen. A direct extension of this elementary concept to irregular stress waveforms provides a logical basis for a statistical analysis of product reliability due to random fatigue. The statistical behavior of the fatigue life is related to the probability distribution of the maxima and minima in a random stress waveform. The fundamental relation between the probability of survival and the maxima-minima is derived in this presentation, which contains a theoretical application to a simple random stress oscillation. The same expression may be used in the development of a computer program to evaluate product reliability from a numerical analysis of experimental data.
Keywords :
Application software; Distribution functions; Fatigue; Frequency; Laboratories; Life testing; Numerical analysis; Probability distribution; Reliability engineering; Stress;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1971.5216143
Filename :
5216143
Link To Document :
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