• DocumentCode
    1321458
  • Title

    Product Reliability and Random Fatigue

  • Author

    Sorensen, Arthur, Jr.

  • Author_Institution
    College of Applied Science and Engineering, University of Wisconsin-Milwaukee, Milwaukee, Wis.
  • Issue
    4
  • fYear
    1971
  • Firstpage
    244
  • Lastpage
    248
  • Abstract
    The fatigue life of a mechanical component in a conventional ional test situation depends upon the stress amplitude. A change in the stress amplitude during a laboratory test-program involves a consideration of the damage produced by each stress cycle imposed upon the test specimen. A direct extension of this elementary concept to irregular stress waveforms provides a logical basis for a statistical analysis of product reliability due to random fatigue. The statistical behavior of the fatigue life is related to the probability distribution of the maxima and minima in a random stress waveform. The fundamental relation between the probability of survival and the maxima-minima is derived in this presentation, which contains a theoretical application to a simple random stress oscillation. The same expression may be used in the development of a computer program to evaluate product reliability from a numerical analysis of experimental data.
  • Keywords
    Application software; Distribution functions; Fatigue; Frequency; Laboratories; Life testing; Numerical analysis; Probability distribution; Reliability engineering; Stress;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1971.5216143
  • Filename
    5216143