Title :
Magnetic Properties of Enhanced Permeability Dielectrics for Nanomagnetic Logic Circuits
Author :
Li, Peng ; Sankar, Vijay K. ; Csaba, Gyorgy ; Hu, Xiaobo Sharon ; Niemier, Michael ; Porod, Wolfgang ; Bernstein, Gary H.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
Enhanced permeability dielectric (EPD) samples were fabricated in an ultra-high-vacuum magnetron sputtering system, and their magnetic properties were studied by a variable-temperature vibrating sample magnetometer. EPDs were fabricated with layers of CoFe forming uniform particles separated by MgO dielectric as insulator. The optimal sample has peak relative low-field permeability (μr) of 452, saturation magnetization (Ms) of 636 emu/cm3 and magnetization at 100 Oe (M100 Oe) of 398 emu/cm3. Effect of low temperature is discussed, and measurements show that the EPD remains superparamagnetic at 173 K; μr, Ms and M100 Oe values at reduced temperatures are higher than those at room temperature. The sample is ferromagnetic at 100 K.
Keywords :
dielectric materials; ferromagnetic materials; logic circuits; magnesium compounds; magnetisation; nanomagnetics; permeability; sputtering; MgO; MgO dielectric; enhanced permeability dielectrics; ferromagnetic; insulator; low temperature effect; magnetic property; magnetometer. EPD; nanomagnetic logic circuit; peak relative low-field permeability; saturation magnetization; temperature 100 K; temperature 173 K; ultra-high-vacuum magnetron sputtering; variable-temperature vibrating sample; Argon; Dielectrics; Magnetization; Permeability; Saturation magnetization; Sputtering; Temperature; Enhanced permeability dielectrics (EPDs); relative permeability; saturation magnetization; superparamagnetic;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2204236
