• DocumentCode
    1321852
  • Title

    CW high power single-lobed far-field operation of long-cavity AlGaAs-GaAs single-quantum-well laser diodes grown by MOCVD

  • Author

    Gavrilovic, P. ; Timofeev, F.N. ; Haw, T. ; Williams, J.E.

  • Author_Institution
    Polaroid Corpo., Cambridge, MA, USA
  • Volume
    27
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    1859
  • Lastpage
    1862
  • Abstract
    Data on long-cavity 100-μm-wide broad-stripe laser diodes that lase with a barrow single-lobed far-field pattern in continuous room-temperature operation are presented. Diodes with a cavity length of 1250 μm emit a power of 200 mW per facet into a 2.5° lobe (full width at half maximum). Short-cavity devices (cavity length of 350 μm) lase with a continuously increasing number of lateral modes right from threshold, and exhibit a far-field divergence that is over three times greater than that of 1250-μm diodes. Explanations for the effect of increasing cavity length on the field patterns of these devices are proposed, based on the measured increase in injected carrier diffusion length in long-cavity diodes and the influence of thermal waveguiding and mirror losses on intermodel discrimination
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; laser modes; semiconductor growth; semiconductor junction lasers; semiconductor quantum wells; vapour phase epitaxial growth; 100 micron; 1250 micron; CW high power single-lobed far-field operation; III-V semiconductors; MOCVD; barrow single-lobed far-field pattern; broad-stripe laser diodes; cavity length; continuous room-temperature operation; facet; far-field divergence; injected carrier diffusion length; intermodel discrimination; lateral modes; long cavity AlGaAs-GaAs single quantum well laser diodes; mirror losses; thermal waveguiding; Diode lasers; Gallium arsenide; Laboratories; Length measurement; Loss measurement; MOCVD; Microelectronics; Mirrors; Power lasers; Semiconductor diodes;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.83387
  • Filename
    83387