Title :
Robust Hall Effect Magnetic Field Sensors for Operation at High Temperatures and in Harsh Radiation Environments
Author :
Abderrahmane, Abdelkader ; Koide, Shota ; Sato, Shin-ichiro ; Ohshima, Takeshi ; Sandhu, Adarsh ; Okada, Hiroshi
Author_Institution :
Electron.-Inspired Interdiscipl. Res. Inst. (EIIRIS), Toyohashi Univ. of Technol., Toyohashi, Japan
Abstract :
We describe the fabrication and magnetoelectric properties of robust, high sensitivity Hall effect sensors fabricated using AlGaN/GaN and AlInSb/InAsSb/AlInSb heterostructures with a two-dimensional electron gas at the heterointerface. The sensitivity of AlInSb/InAsSb/AlInSb heterostructure clearly degrades above ~ 150°C. The AlGaN/GaN 2DEG Hall sensors were stable up to at least 400 °C and even after irradiation of 380 keV protons with a fluence of 1×1014 cm- 2, where AlInSb/InAsSb/AlInSb heterostructure showed an increase in the sheet carrier density. The feasibility of applications of the AlGaN/GaN and AlInSb/InAsSb/AlInSb Hall sensor for harsh radiation environment is discussed.
Keywords :
Hall effect devices; III-V semiconductors; aluminium compounds; arsenic compounds; gallium compounds; indium compounds; magnetic field measurement; magnetic sensors; magnetoelectric effects; sensitivity; two-dimensional electron gas; wide band gap semiconductors; AlGaN-GaN; AlInSb-InAsSb-AlInSb; electron volt energy 380 eV; harsh radiation environments; heterointerface; high temperature operation; magnetoelectric properties; robust hall effect magnetic field sensors; sensitivity; sheet carrier density; temperature 400 degC; two-dimensional electron gas; Aluminum gallium nitride; Gallium nitride; HEMTs; Protons; Radiation effects; Temperature sensors; Compound semiconductor; Hall effect devices; ion radiation effects; robust stability;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2196986