DocumentCode
1321968
Title
High-Speed InAs Quantum-Dot Electrooptic Phase Modulators
Author
Liu, Wei ; Kim, Richard S. ; Liang, Baolai ; Huffaker, Diana L. ; Fetterman, Harold R.
Author_Institution
Electr. Eng. Dept., Univ. of California, Los Angeles, CA, USA
Volume
23
Issue
23
fYear
2011
Firstpage
1748
Lastpage
1750
Abstract
In this letter, we report results of direct current (dc) and radio-frequency (RF) characteristics of self-assembled InAs quantum-dot (QD) electrooptic modulators. Although dc modulation results have been reported in the literature, these are the first high-frequency designs and measurements. These QD modulator wafers were grown by molecular beam epitaxy (MBE) and phase modulator devices were fabricated with coplanar traveling-wave electrodes. For the 800-μm-long modulators, the half-wave voltage Vπ was measured as 11.4 V at 1.55 μm and 7.34 V at 1.32 μm. The phase variation is 21.9°/(mm·V). The linear electrooptic coefficient T41 is calculated to be 35.4 pm/V for QDs. These modulators have a 3-dB bandwidth of 10 GHz. A signal-to-noise ratio of 9 dB was measured at 20 GHz.
Keywords
III-V semiconductors; electro-optical devices; indium compounds; molecular beam epitaxial growth; optical modulation; semiconductor quantum dots; InAs; bandwidth 10 GHz; coplanar traveling-wave electrodes; frequency 20 GHz; high-speed quantum-dot electrooptic phase modulators; molecular beam epitaxy; phase modulator devices; quantum-dot modulator wafers; signal-to-noise ratio; voltage 11.4 V; voltage 7.34 V; wavelength 1.32 mum; wavelength 1.55 mum; wavelength 800 mum; Electrooptic effects; Electrooptic modulators; Frequency measurement; Gallium arsenide; Phase modulation; 3-dB bandwidth; Electrooptic modulator; half-wave voltage; quantum-dot (QD) modulator; semiconductor quantum dots (QDs);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2011.2168201
Filename
6020742
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