DocumentCode :
1321968
Title :
High-Speed InAs Quantum-Dot Electrooptic Phase Modulators
Author :
Liu, Wei ; Kim, Richard S. ; Liang, Baolai ; Huffaker, Diana L. ; Fetterman, Harold R.
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, CA, USA
Volume :
23
Issue :
23
fYear :
2011
Firstpage :
1748
Lastpage :
1750
Abstract :
In this letter, we report results of direct current (dc) and radio-frequency (RF) characteristics of self-assembled InAs quantum-dot (QD) electrooptic modulators. Although dc modulation results have been reported in the literature, these are the first high-frequency designs and measurements. These QD modulator wafers were grown by molecular beam epitaxy (MBE) and phase modulator devices were fabricated with coplanar traveling-wave electrodes. For the 800-μm-long modulators, the half-wave voltage Vπ was measured as 11.4 V at 1.55 μm and 7.34 V at 1.32 μm. The phase variation is 21.9°/(mm·V). The linear electrooptic coefficient T41 is calculated to be 35.4 pm/V for QDs. These modulators have a 3-dB bandwidth of 10 GHz. A signal-to-noise ratio of 9 dB was measured at 20 GHz.
Keywords :
III-V semiconductors; electro-optical devices; indium compounds; molecular beam epitaxial growth; optical modulation; semiconductor quantum dots; InAs; bandwidth 10 GHz; coplanar traveling-wave electrodes; frequency 20 GHz; high-speed quantum-dot electrooptic phase modulators; molecular beam epitaxy; phase modulator devices; quantum-dot modulator wafers; signal-to-noise ratio; voltage 11.4 V; voltage 7.34 V; wavelength 1.32 mum; wavelength 1.55 mum; wavelength 800 mum; Electrooptic effects; Electrooptic modulators; Frequency measurement; Gallium arsenide; Phase modulation; 3-dB bandwidth; Electrooptic modulator; half-wave voltage; quantum-dot (QD) modulator; semiconductor quantum dots (QDs);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2168201
Filename :
6020742
Link To Document :
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