• DocumentCode
    1322590
  • Title

    Failure Modes in Gold-Aluminum Thermocompression Bonds

  • Author

    Anderson, J.H., Jr. ; Cox, William P.

  • Author_Institution
    Lockheed Missiles and Space Company, Palo Alto, Calif.; Department of Chemical Engineering, University of Rochester, Rochester, N. Y.
  • Issue
    4
  • fYear
    1969
  • Firstpage
    206
  • Lastpage
    207
  • Abstract
    Electrical opens and mechanical fracture have been reported as two distinct failure modes in gold-aluminum thermocompression ball bonds. It is found that the thickness of the aluminum film to which the gold wires are bonded and the temperature at which the bonds are held during aging determine which failure mode will be observed. The electrical failure mode predominates when bonds made to aluminum films 5000Å or more in thickness are aged at temperatures above 200°C but at 200°C both failure modes are observed. Mechanical fracture is expected to be the dominant failure mode when ball bonds to these 5000-10000-Å films are aged at temperatures below 200°C. Bonds to thinner aluminum films (500-3000 Å) exhibited only the electrical failure mode.
  • Keywords
    Aging; Aluminum; Electric resistance; Electrical resistance measurement; Furnaces; Gold; Missiles; Temperature; Testing; Wire;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1969.5216358
  • Filename
    5216358