Title :
Dielectric and ferroelectric properties of Bi(Zn1/2Ti1/2)O3??PbTiO3??PbZrO3 ternary ceramics
Author :
Yujuan Xie ; Ling Chen ; Wei Ren ; Zuo-Guang Ye
Author_Institution :
Dept. of Chem., Simon Fraser Univ., Burnaby, BC, Canada
fDate :
9/1/2011 12:00:00 AM
Abstract :
Ceramics of a new ternary solid solution system, xBi(Zn1/2Ti1/2)O3-yPbTiO3-zPbZrO3 (xBZT-yPT-zPZ), with compositions along the solubility limit curve are prepared by solid-state reaction and sintering technique. Two morphotropic phase boundaries (MPBs) separating the orthorhombic and tetragonal (MPBO-T) phases and the tetragonal and rhombohedral (MPBT-R) phases, respectively, are observed with increasing z (0.10 ≤ × ≤ 0.21; 0 ≤ y ≤ 0.49). It is found that the transition from the ferroelectric to paraelectric phase becomes more diffuse with the addition of BZT into the PZT solid solution. Enhanced dielectric and ferroelectric properties appear at MPBR-T, which exists over a wide composition region (0.45 ≤ z ≤ 0.6), as revealed by X-ray diffraction and dielectric measurements. The dielectric constant reaches a maximum value (ε´ = 1250) on the tetragonal majority side of the MPB. The highest remnant polarization (Pr = 34.2 μC/cm2) is found in the composition at the center of the MPB, where the rhombohedral and tetragonal phases coexist in almost equal quantities.
Keywords :
X-ray diffraction; bismuth compounds; dielectric polarisation; ferroelectric ceramics; ferroelectric transitions; lead compounds; permittivity; sintering; solid solubility; solid solutions; BZT addition; Bi(Zn0.5Ti0.5)O3-PbTiO3-PbZrO3; PZT solid solution; X-ray diffraction; XRD; composition region; dielectric constant; dielectric measurements; dielectric properties; ferroelectric phase; ferroelectric properties; morphotropic phase boundaries; orthorhombic phase; paraelectric phase; remnant polarization; rhombohedral phase; sintering technique; solid-state reaction; solubility limit curve; ternary ceramics; ternary solid solution system; tetragonal phase; Ceramics; Dielectric constant; Dielectric losses; Dielectric measurements; Reflection; Temperature;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2011.2027