Title :
Translation of the problem of complete test set generation to pseudo-Boolean programming
Author :
Bhattacharjee, Pramode Ranjan ; Basu, Sanjoy Kumar ; Paul, Jogesh Chandra
Author_Institution :
Dept. of Phys., M.B.B. College, Tripura, India
fDate :
7/1/1991 12:00:00 AM
Abstract :
An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation
Keywords :
Boolean functions; formal logic; logic programming; logic testing; Boolean function; complete test set generation; logical expressions; pseudo-Boolean programming; real transforms; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Functional programming; Graph theory; Physics;
Journal_Title :
Computers, IEEE Transactions on