• DocumentCode
    1322723
  • Title

    Translation of the problem of complete test set generation to pseudo-Boolean programming

  • Author

    Bhattacharjee, Pramode Ranjan ; Basu, Sanjoy Kumar ; Paul, Jogesh Chandra

  • Author_Institution
    Dept. of Phys., M.B.B. College, Tripura, India
  • Volume
    40
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    864
  • Lastpage
    867
  • Abstract
    An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation
  • Keywords
    Boolean functions; formal logic; logic programming; logic testing; Boolean function; complete test set generation; logical expressions; pseudo-Boolean programming; real transforms; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Functional programming; Graph theory; Physics;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.83624
  • Filename
    83624