DocumentCode
1322723
Title
Translation of the problem of complete test set generation to pseudo-Boolean programming
Author
Bhattacharjee, Pramode Ranjan ; Basu, Sanjoy Kumar ; Paul, Jogesh Chandra
Author_Institution
Dept. of Phys., M.B.B. College, Tripura, India
Volume
40
Issue
7
fYear
1991
fDate
7/1/1991 12:00:00 AM
Firstpage
864
Lastpage
867
Abstract
An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation
Keywords
Boolean functions; formal logic; logic programming; logic testing; Boolean function; complete test set generation; logical expressions; pseudo-Boolean programming; real transforms; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Functional programming; Graph theory; Physics;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.83624
Filename
83624
Link To Document