DocumentCode :
1322723
Title :
Translation of the problem of complete test set generation to pseudo-Boolean programming
Author :
Bhattacharjee, Pramode Ranjan ; Basu, Sanjoy Kumar ; Paul, Jogesh Chandra
Author_Institution :
Dept. of Phys., M.B.B. College, Tripura, India
Volume :
40
Issue :
7
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
864
Lastpage :
867
Abstract :
An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation
Keywords :
Boolean functions; formal logic; logic programming; logic testing; Boolean function; complete test set generation; logical expressions; pseudo-Boolean programming; real transforms; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Functional programming; Graph theory; Physics;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.83624
Filename :
83624
Link To Document :
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