DocumentCode :
1322729
Title :
Aliasing probabilities for feedback signature compression of test data
Author :
Robinson, John P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ. Iowa City, IA, USA
Volume :
40
Issue :
7
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
867
Lastpage :
873
Abstract :
A computationally efficient Markov state space model is developed for determining the aliasing probability of a linear feedback shift register when used for test data reduction. The model studied can be used to test data errors which have a constant of probability of error, correlated or repeated use errors, or time varying error probability. Based on a number of simulations of various error models and feedback polynomials it appears that a primitive polynomial, with about half its terms nonzero, has the best dynamic performance in most cases
Keywords :
Markov processes; logic testing; shift registers; Markov state space model; aliasing probability; data reduction; error models; feedback polynomials; feedback signature compression; linear feedback shift register; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Computer networks; Feedback; Functional programming; Logic circuits; Logic testing; Minimization;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.83625
Filename :
83625
Link To Document :
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