Title :
On-Chip Intra Decoupling Measurements for Integrated Magnetic Thin Film
Author :
Yamaguchi, Masahiro ; Kodate, Wataru ; Endo, Yasushi
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Abstract :
Performance of magnetic thin-film is evaluated as a candidate for on-chip inductive intra noise decouplor. Miniature loop coils implemented on a 90 nm design CMOS test element group (TEG) chip are used as the noise transmitter and receiver. Differential transmission parameter Sdd21 is evaluated as the measure of intra-decoupling. Magnetic film is useful for frequency selective noise decouplor. The coupling is supported most at the ferromagnetic resonance (FMR) frequency, which is deviated from its intrinsic frequency and the degree of deviation can be calculated by using characteristic length. These results demonstrate that the proposed method is useful to characterize the IC chip level noise suppressor in the GHz range.
Keywords :
CMOS integrated circuits; ferromagnetic resonance; magnetic thin film devices; CMOS test element group chip; IC chip level noise suppressor; differential transmission parameter; ferromagnetic resonance frequency; frequency selective noise decouplor; integrated magnetic thin film; intrinsic frequency; miniature loop coil; noise receiver; noise transmitter; on-chip inductive intra noise decouplor; on-chip intradecoupling measurement; performance evaluation; size 90 nm; Coils; Frequency measurement; Magnetic flux; Magnetic resonance; Magnetic resonance imaging; Noise; Semiconductor device measurement; Desensitization; electromagnetic compatibility; ferromagnetic films; ferromagnetic resonance; on-chip;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2208221