Improved design for multistate reflectometer (with two power detectors) for measuring reflection coefficients of microwave devices

Author

Yeo, S.P. ; Tay, S.T.

Author_Institution

Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore

Volume

49

Issue

1

fYear

2000

fDate

2/1/2000 12:00:00 AM

Firstpage

61

Lastpage

65

Abstract

The optimum-performance criteria originally developed for use with six-port reflectometers may, under certain circumstances, be extended to the design of the multistate reflectometer (which utilizes two power detectors to measure the reflection coefficients of microwave components). Test results-from simulations as well as experiments-have confirmed that the novel WR90 multistate instrument proposed in the present paper is able to yield near-optimum performance over the entire waveguide bandwidth

Keywords

microwave reflectometry; multiport networks; network analysers; reflectometers; four-port black box; improved design; microwave devices; microwave reflectometry; multiport circuits; multistate reflectometer; optimum-performance criteria; reflection coefficients measurement; two power detectors; Circuit testing; Detectors; Instruments; Microwave circuits; Microwave devices; Microwave measurements; Millimeter wave measurements; Power measurement; Reflection; Reflectometry;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.836310

Filename

836310