Title :
Active I-V Characteristic Measurement
Author_Institution :
Thayer School of Engineering, Dartmouth College, Hanover, N. H.
Abstract :
The use of I-V characteristics to determine the behavior of active devices is increasing. The standard swept frequency schemes suffer from frequency limitations. A technique for pulsed I-V measurements that can be employed in most laboratories is described and its application to measuring the active behavior of an IMPATT device is demonstrated.
Keywords :
Current measurement; Multiplexing; Oscilloscopes; Plasma measurements; Pulse measurements; Switches; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1971.5570722
