DocumentCode
1323031
Title
Triggering of Transient Latch-up by System-Level ESD
Author
Brodbeck, Tilo ; Stadler, Wolfgang ; Baumann, Christian ; Esmark, Kai ; Domanski, Krzysztof
Author_Institution
Infineon Technol. AG, Munich, Germany
Volume
11
Issue
4
fYear
2011
Firstpage
509
Lastpage
515
Abstract
This paper investigates the influences of temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system-level surges as, e.g., seen in cable discharge events, even very short trigger pulses can cause TLU.
Keywords
electrostatic discharge; integrated circuit testing; IC LU test; TLU triggering; cable discharge event; high discharge current; integrated circuit latch-up test; system-level ESD; system-level surge; transient latch-up triggering; transient trigger parameter; very short trigger pulse; Electrostatic discharge; Power supplies; Pulse circuits; Temperature measurement; Thyristors; Transient analysis; Cable discharge event (CDE); electrostatic discharge (ESD); latch-up (LU); system-level ESD; transient LU (TLU); transition line pulse (TLP);
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2011.2165072
Filename
6021340
Link To Document