DocumentCode :
1323200
Title :
Diagnostics for logic networks
Author :
Susskind, A.K.
Author_Institution :
Lehigh University
Volume :
10
Issue :
10
fYear :
1973
Firstpage :
40
Lastpage :
47
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Large scale integration; Logic testing; Sequential analysis; Sequential circuits; System testing;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1973.5216474
Filename :
5216474
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1323200
