• DocumentCode
    1323367
  • Title

    Design and Fabrication of a Planar Three-DOFs MEMS-Based Manipulator

  • Author

    De Jong, Boudewijn R. ; Brouwer, Dannis M. ; De Boer, Meint J. ; Jansen, Henri V. ; Soemers, Herman M J R ; Krijnen, Gijs J M

  • Author_Institution
    MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
  • Volume
    19
  • Issue
    5
  • fYear
    2010
  • Firstpage
    1116
  • Lastpage
    1130
  • Abstract
    Abstract-This paper presents the design, modeling, and fabrication of a planar three-degrees-of-freedom parallel kinematic manipulator, fabricated with a simple two-mask process in conventional highly doped single-crystalline silicon (SCS) wafers (100). The manipulator´s purpose is to provide accurate and stable positioning of a small sample (10 × 20 × 0.2 μm3), e.g., within a transmission electron microscope. The manipulator design is based on the principles of exact constraint design, resulting in a high actuation-compliance combined with a relatively high suspension stiffness. A modal analysis shows that the fourth vibration mode frequency is at least a factor 11 higher than the first three actuation-related mode frequencies. The comb-drive actuators are modeled in combination with the shuttle suspensions gaining insight into the side and rotational pull-in stability conditions. The two-mask fabrication process enables high-aspect-ratio structures, combined with electrical trench insulation. Trench insulation allows structures in conventional wafers to be mechanically connected while being electrically insulated from each other. Device characterization shows high linearity of displacement wrt voltage squared over ±10 μm stroke in the xand y-directions and ±2° rotation at a maximum of 50 V driving voltage. Out-of-plane displacement crosstalk due to in-plane actuation in resonance is measured to be less than 20 pm. The hysteresis in SCS, measured using white light interferometry, is shown to be extremely small.
  • Keywords
    actuators; elemental semiconductors; interferometry; isolation technology; masks; microfabrication; micromanipulators; silicon; transmission electron microscopes; SCS wafers; Si; actuation related mode frequencies; comb-drive actuators; electrical trench insulation; high-aspect-ratio structures; modal analysis; out-of-plane displacement crosstalk; planar three-DOF MEMS-based manipulator; planar three-degrees-of-freedom parallel kinematic manipulator; rotational pull-in stability conditions; single crystalline silicon; transmission electron microscope; two mask fabrication process; vibration mode frequency; white light interferometry; Electrostatics; Fabrication; Force; Manipulators; Springs; Suspensions; Teeth; Compliant mechanism; electrostatic actuators; exact constraint design; multidegrees of freedom; nanometer positioning; precision engineering; trench isolation;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2010.2067196
  • Filename
    5570855