• DocumentCode
    1323445
  • Title

    Design criteria of low-power low-noise charge amplifiers in VLSI bipolar technology

  • Author

    Bertuccio, G. ; Fasoli, L. ; Sampietro, M.

  • Author_Institution
    Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
  • Volume
    44
  • Issue
    5
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    1708
  • Lastpage
    1718
  • Abstract
    The criteria underlying the design of low-noise front-end integrated electronics for radiation and particle detectors have been determined, taking into account the limits in the allowable power dissipation. The analysis specifically treats integrated amplifiers employing silicon bipolar transistors, whose performance has been studied to highlight the ultimate noise limit and the roles of the front-end device parameters such as the current gain, the base spreading resistance, the junction and diffusion capacitances, the transition frequency, and the device geometry. The relationships existing among the power dissipated in the front-end stage, the noise performance, and the characteristic of signal processing are derived
  • Keywords
    VLSI; amplifiers; analogue processing circuits; bipolar analogue integrated circuits; detector circuits; integrated circuit design; integrated circuit noise; nuclear electronics; VLSI bipolar technology; amplifier noise; analog integrated circuit; base spreading resistance; bipolar transistors; charge measurement; current gain; design criteria; device geometry; diffusion capacitance; front-end device parameters; integrated amplifiers; integrated circuit design; junction capacitance; low-noise front-end integrated electronics; low-power low-noise charge amplifiers; particle detectors; power dissipation; signal processing; silicon bipolar transistors; transition frequency; Bipolar transistors; Capacitance; Frequency; Low-noise amplifiers; Performance analysis; Performance gain; Power dissipation; Radiation detectors; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.633423
  • Filename
    633423