DocumentCode :
1323523
Title :
Monostable–Bistable Transition Logic Element Formed by Tunneling Real-Space Transfer Transistors With Negative Differential Resistance
Author :
Yu, Xin ; Mao, Lu-Hong ; Guo, Wei-Lian ; Zhang, Shi-Lin ; Xie, Sheng ; Chen, Yan
Author_Institution :
Dept. of Electron. & Inf. Eng., Tianjin Univ., Tianjin, China
Volume :
31
Issue :
11
fYear :
2010
Firstpage :
1224
Lastpage :
1226
Abstract :
We demonstrate three-terminal λ-type negative differential resistance (NDR) tunneling real-space transfer transistors (TRSTT) with InGaAs and a δ-doped GaAs dual-channel structure on a (100) GaAs substrate. The NDR mechanism is attributed to the electron tunneling transfer from a high-mobility InGaAs channel to a low-mobility δ-doped GaAs channel, as well as to a gate electrode through a Schottky cap layer. The maximum of the peak-to-valley current ratio and the transconductance of the peak current density (gm = ΔJPVGS) reach 3.3 and 72 mS/mm, respectively. The invert operation of MOBILE is realized by employing two TRSTTs connected in series at room temperature.
Keywords :
III-V semiconductors; Schottky barriers; carrier mobility; gallium arsenide; high electron mobility transistors; indium compounds; logic gates; tunnelling; GaAs; InGaAs; Schottky cap layer; dual channel structure; electron tunneling transfer; high mobility channel; monostable-bistable transition logic element; three terminal λ-type negative differential resistance; tunneling real space transfer transistors; Gallium arsenide; Indium gallium arsenide; Logic gates; Mobile communication; Resistance; Transistors; Tunneling; Delta-doped ($delta$-doped); monostable–bistable transition logic elements (MOBILEs); negative differential resistance (NDR); tunneling real-space transfer (TRST);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2010.2068272
Filename :
5570891
Link To Document :
بازگشت