Title :
Sequential Labeling Using Deep-Structured Conditional Random Fields
Author :
Yu, Dong ; Wang, Shizhen ; Deng, Li
Author_Institution :
Microsoft Res., Redmond, WA, USA
Abstract :
We develop and present the deep-structured conditional random field (CRF), a multi-layer CRF model in which each higher layer´s input observation sequence consists of the previous layer´s observation sequence and the resulted frame-level marginal probabilities. Such a structure can closely approximate the long-range state dependency using only linear-chain or zeroth-order CRFs by constructing features on the previous layer´s output (belief). Although the final layer is trained to maximize the log-likelihood of the state (label) sequence, each lower layer is optimized by maximizing the frame-level marginal probabilities. In this deep-structured CRF, both parameter estimation and state sequence inference are carried out efficiently layer-by-layer from bottom to top. We evaluate the deep-structured CRF on two natural language processing tasks: search query tagging and advertisement field segmentation. The experimental results demonstrate that the deep-structured CRF achieves word labeling accuracies that are significantly higher than the best results reported on these tasks using the same labeled training set.
Keywords :
inference mechanisms; natural language processing; probability; query processing; random processes; advertisement field segmentation; deep-structured conditional random fields; frame-level marginal probabilities; labeled training set; linear-chain CRF; multilayer CRF model; natural language processing tasks; parameter estimation; search query tagging; sequential labeling; state sequence inference; zeroth-order CRF; Accuracy; Hidden Markov models; Labeling; Natural language processing; Parameter estimation; Tagging; Training; Conditional random fields (CRFs); deep-structure; marginal probability; natural language processing; sequential labeling; word tagging;
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
DOI :
10.1109/JSTSP.2010.2075990