Title :
Minimal test set for multi-output threshold circuits implemented as bubble sorting networks
Author :
Piestrak, S.J. ; Dandache, A.
Author_Institution :
Inst. of Eng. Cybern., Wroclaw Univ., Poland
fDate :
2/3/2000 12:00:00 AM
Abstract :
An n-input sorting network can be used to implement all n-variable symmetric threshold functions. It is shown that a systolic bubble sorting network can be tested for all single stuck-at faults by carrying out only 2 n tests
Keywords :
fault diagnosis; logic testing; multivalued logic circuits; sorting; threshold logic; bubble sorting networks; minimal test set; multi-output threshold circuits; n-input sorting network; n-variable symmetric threshold functions; stuck-at faults;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000226
