DocumentCode :
1323801
Title :
Real Multitouch Panel Without Ghost Points Based on Resistive Patterning
Author :
Wen-Yang Chang ; Heng-Ju Lin
Author_Institution :
Dept. of Mech. & Comput.-Aided Eng., Nat. Formosa Univ., Yunlin, Taiwan
Volume :
7
Issue :
11
fYear :
2011
Firstpage :
601
Lastpage :
606
Abstract :
The real multitouch panel without ghost points is investigated using the structural patterns and an algorithm matrix of the two configurations. The pixels of patterns on the multitouch panel include virtual high and low resistances. The algorithm matrix with two configurations of equivalent circuit is derived using a voltage divider rule for array scanning. The fabrication process of structural patterns is carried out using microelectromechanical systems technology. The optical transmittance and absorbance of the multitouch panel in the UV, Vis, and IR regions are measured using a spectrophotometer. The multitouch panel, containing an array of 30 × 30, has a pixel size of 2 × 2 mm2 and a pitch distance of 2 mm. The average values of high and low impedances are 53.23 and 9.3 kΩ, respectively. The maximum transmittance is about 74.2% at the wavelength of 692 nm. The multitouch panel based on high and low impedance patterns has good adjacent touch resolution for reality multitouch applications. In addition, the patterned design and the algorithm matrix provide unlimited multitouch points and avoid the ghost points.
Keywords :
micromechanical devices; spectrophotometers; touch sensitive screens; voltage dividers; IR regions; UV; algorithm matrix; array scanning; equivalent circuit; fabrication process; ghost points; microelectromechanical systems technology; multitouch panel; optical transmittance; resistive patterning; size 692 nm; spectrophotometer; voltage divider rule; Fabrication; Glass; Impedance; Indium tin oxide; Positron emission tomography; Resistance; Substrates; Ghost point; high/low impedance; multitouch; patterning;
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2011.2159479
Filename :
6021887
Link To Document :
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