DocumentCode :
132394
Title :
Evaluation of gallium nitride transistors in high frequency resonant and soft-switching DC-DC converters
Author :
Reusch, David ; Strydom, J.
Author_Institution :
Efficient Power Conversion Corp., El Segundo, CA, USA
fYear :
2014
fDate :
16-20 March 2014
Firstpage :
464
Lastpage :
470
Abstract :
The emergence of gallium nitride (GaN) based power devices offers the potential to achieve higher efficiencies and higher switching frequencies than possible with aging silicon (Si) power MOSFETs. In this paper, we will evaluate the ability of gallium nitride transistors to improve efficiency and output power density in high frequency resonant and soft-switching applications. To experimentally verify the benefits of replacing Si MOSFETs with enhancement mode GaN transistors (eGaN®FETs) in a high frequency resonant converter, 48 V to 12 V unregulated isolated bus converter prototypes operating at a switching frequency of 1.2 MHz and an output power of up to 400W are compared using Si and GaN power devices.
Keywords :
III-V semiconductors; elemental semiconductors; gallium compounds; power MOSFET; power transistors; resonant power convertors; silicon; switching convertors; wide band gap semiconductors; GaN; GaN power device; Si; Si power device; aging silicon power MOSFET; frequency 1.2 MHz; gallium nitride transistor; high frequency resonant converter; power density; soft switching DC-DC converter; unregulated isolated bus converter prototype; voltage 48 V to 12 V; Gallium nitride; Logic gates; MOSFET; Quality of service; Silicon; Zero voltage switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
Conference_Location :
Fort Worth, TX
Type :
conf
DOI :
10.1109/APEC.2014.6803349
Filename :
6803349
Link To Document :
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