• DocumentCode
    132394
  • Title

    Evaluation of gallium nitride transistors in high frequency resonant and soft-switching DC-DC converters

  • Author

    Reusch, David ; Strydom, J.

  • Author_Institution
    Efficient Power Conversion Corp., El Segundo, CA, USA
  • fYear
    2014
  • fDate
    16-20 March 2014
  • Firstpage
    464
  • Lastpage
    470
  • Abstract
    The emergence of gallium nitride (GaN) based power devices offers the potential to achieve higher efficiencies and higher switching frequencies than possible with aging silicon (Si) power MOSFETs. In this paper, we will evaluate the ability of gallium nitride transistors to improve efficiency and output power density in high frequency resonant and soft-switching applications. To experimentally verify the benefits of replacing Si MOSFETs with enhancement mode GaN transistors (eGaN®FETs) in a high frequency resonant converter, 48 V to 12 V unregulated isolated bus converter prototypes operating at a switching frequency of 1.2 MHz and an output power of up to 400W are compared using Si and GaN power devices.
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium compounds; power MOSFET; power transistors; resonant power convertors; silicon; switching convertors; wide band gap semiconductors; GaN; GaN power device; Si; Si power device; aging silicon power MOSFET; frequency 1.2 MHz; gallium nitride transistor; high frequency resonant converter; power density; soft switching DC-DC converter; unregulated isolated bus converter prototype; voltage 48 V to 12 V; Gallium nitride; Logic gates; MOSFET; Quality of service; Silicon; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • Type

    conf

  • DOI
    10.1109/APEC.2014.6803349
  • Filename
    6803349