Title :
Double-sided nickel-tin transient liquid phase bonding for double-sided cooling
Author :
Sang Won Yoon ; Shiozaki, Koji ; Kato, Toshihiko
Author_Institution :
Electron. Res. Dept., Toyota Motor Eng. & Manuf. North America, Ann Arbor, MI, USA
Abstract :
This paper presents double-sided nickel-tin transient liquid phase (Ni-Sn TLP) bonding technology and its application to double-sided cooling structures used in automotive power modules. Double-sided cooling is an emerging solution for heat dissipation problems inside compact power modules (used in electrified vehicles) and requires components providing highlevel reliability. This requirement is satisfied by Ni-Sn TLP bonding technology facilitating a high re-melting temperature reaching ~794 °C. Double-sided Ni-Sn TLP bonding is demonstrated using conventional power diodes having nickel layers on both sides. Electrical characterizations of the doubleside bonded diodes reveal consistent and reproducible bonding quality. In addition, excellent high temperature reliability of double-sided TLP bonding is exhibited by high temperature storage (at 300 °C) and thermal cycling (from -40 to 200 °C) evaluations. This presentation is the first time demonstration of double-sided TLP bonding using active power devices.
Keywords :
automotive electronics; bonding processes; cooling; modules; nickel; power electronics; power semiconductor diodes; tin; Ni-Sn; active power device; automotive power module; double sided cooling structure; double sided transient liquid phase bonding; doubleside bonded diodes; power diode; temperature -40 C to 200 C; temperature 300 C; thermal cycling; Bonding; Cooling; Multichip modules; Power electronics; Reliability; Silicon;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
Conference_Location :
Fort Worth, TX
DOI :
10.1109/APEC.2014.6803359