DocumentCode :
1324234
Title :
Application of TMS, TMGe to high-energy X-ray tomography
Author :
Mathy, F. ; Lepert, S. ; Thomas, G.
Author_Institution :
CEA, Grenoble, France
Volume :
26
Issue :
4
fYear :
1991
fDate :
8/1/1991 12:00:00 AM
Firstpage :
631
Lastpage :
635
Abstract :
The ionic mobilities of two organometallic compounds, TMS (tetramethylsilane) and TMGe (tetramethylgermanium), were measured. A TMGe detector designed for high-energy tomography was successfully tested on a 100 Hz pulsed X-ray beam produced by a 8 MeV linear accelerator; a dynamic range of five decades was measured, corresponding to 25 cm lead attenuation, with a max dose rate of 0.43 rad/s. The ratio between the electronic pulse current and the ionic interpulse current, mostly dependent on the duty cycle, was improved by means of an electronic circuit integrating during and just before the pulse
Keywords :
X-ray detection and measurement; ionic conduction in solids; organic compounds; TMGe; TMGe detector; TMS; duty cycle; dynamic range; electronic circuit; electronic pulse current; high-energy X-ray tomography; ionic interpulse current; ionic mobilities; lead attenuation; max dose rate; organometallic compounds; pulsed X-ray beam; tetramethylgermanium; tetramethylsilane; Attenuation measurement; Dynamic range; Linear accelerators; Particle beams; Pulse circuits; Pulse measurements; Testing; X-ray detection; X-ray detectors; X-ray tomography;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.83682
Filename :
83682
Link To Document :
بازگشت