DocumentCode :
132433
Title :
Influence of RMS calculation methods on the measurement of voltage dips
Author :
Ye, Gu ; Cuk, V. ; Cobben, J.F.G. ; Kling, W.L.
fYear :
2014
fDate :
2-5 Sept. 2014
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents the results of the analysis on the influence of different RMS calculation methods to the detection and characterization of voltage dips. The analytical calculation of measurement parameters for voltage dips and the systematic deviations in characterization due to the dip detection algorithms are discussed for the general RMS calculation methods, sliding window and half cycle methods. Stochastic processes are carried out with different fault types, fault locations and event occurring instants in a real medium voltage network, an evaluation study is presented with the statistic results.
Keywords :
fault location; power supply quality; power system measurement; stochastic processes; RMS calculation methods; analytical calculation; dip detection algorithms; measurement parameters; stochastic processes; voltage dips measurement; Circuit faults; Computational efficiency; Delays; Phase measurement; Threshold voltage; Voltage fluctuations; Voltage measurement; RMS; duration; magnitude; measurement; voltage dip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Conference (UPEC), 2014 49th International Universities
Conference_Location :
Cluj-Napoca
Print_ISBN :
978-1-4799-6556-4
Type :
conf
DOI :
10.1109/UPEC.2014.6934738
Filename :
6934738
Link To Document :
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