• DocumentCode
    132433
  • Title

    Influence of RMS calculation methods on the measurement of voltage dips

  • Author

    Ye, Gu ; Cuk, V. ; Cobben, J.F.G. ; Kling, W.L.

  • fYear
    2014
  • fDate
    2-5 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents the results of the analysis on the influence of different RMS calculation methods to the detection and characterization of voltage dips. The analytical calculation of measurement parameters for voltage dips and the systematic deviations in characterization due to the dip detection algorithms are discussed for the general RMS calculation methods, sliding window and half cycle methods. Stochastic processes are carried out with different fault types, fault locations and event occurring instants in a real medium voltage network, an evaluation study is presented with the statistic results.
  • Keywords
    fault location; power supply quality; power system measurement; stochastic processes; RMS calculation methods; analytical calculation; dip detection algorithms; measurement parameters; stochastic processes; voltage dips measurement; Circuit faults; Computational efficiency; Delays; Phase measurement; Threshold voltage; Voltage fluctuations; Voltage measurement; RMS; duration; magnitude; measurement; voltage dip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Conference (UPEC), 2014 49th International Universities
  • Conference_Location
    Cluj-Napoca
  • Print_ISBN
    978-1-4799-6556-4
  • Type

    conf

  • DOI
    10.1109/UPEC.2014.6934738
  • Filename
    6934738