DocumentCode
132433
Title
Influence of RMS calculation methods on the measurement of voltage dips
Author
Ye, Gu ; Cuk, V. ; Cobben, J.F.G. ; Kling, W.L.
fYear
2014
fDate
2-5 Sept. 2014
Firstpage
1
Lastpage
6
Abstract
This paper presents the results of the analysis on the influence of different RMS calculation methods to the detection and characterization of voltage dips. The analytical calculation of measurement parameters for voltage dips and the systematic deviations in characterization due to the dip detection algorithms are discussed for the general RMS calculation methods, sliding window and half cycle methods. Stochastic processes are carried out with different fault types, fault locations and event occurring instants in a real medium voltage network, an evaluation study is presented with the statistic results.
Keywords
fault location; power supply quality; power system measurement; stochastic processes; RMS calculation methods; analytical calculation; dip detection algorithms; measurement parameters; stochastic processes; voltage dips measurement; Circuit faults; Computational efficiency; Delays; Phase measurement; Threshold voltage; Voltage fluctuations; Voltage measurement; RMS; duration; magnitude; measurement; voltage dip;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Conference (UPEC), 2014 49th International Universities
Conference_Location
Cluj-Napoca
Print_ISBN
978-1-4799-6556-4
Type
conf
DOI
10.1109/UPEC.2014.6934738
Filename
6934738
Link To Document