• DocumentCode
    1324440
  • Title

    Monitoring Solder Fatigue in a Power Module Using Case-Above-Ambient Temperature Rise

  • Author

    Dawei Xiang ; Li Ran ; Tavner, Peter ; Bryant, A. ; Shaoyong Yang ; Mawby, Philip

  • Author_Institution
    Sch. of Eng. & Comput. Sci., Durham Univ., Durham, UK
  • Volume
    47
  • Issue
    6
  • fYear
    2011
  • Firstpage
    2578
  • Lastpage
    2591
  • Abstract
    Condition monitoring is needed in power electronic systems as a cost-effective means of improving reliability. Packaging-related solder fatigue has been identified as one of the main root causes of power electronic module failures. This paper presents a method to monitor solder fatigue inside a module by identifying the increase of internal thermal resistance due to that solder fatigue, taking account of the masking effect of the variable operating point. It is assumed that the total loss in the module increases as junction temperature rises, causing an increase in case-above-ambient temperature rise, which can be measured. A dynamic thermal model of the heat sink is utilized to estimate the power loss from temperature measurements, while a device power loss model is developed to estimate the internal thermal resistance by considering the converter electrical loading. Experiment and simulation are used to demonstrate the concept and verify the method.
  • Keywords
    condition monitoring; failure analysis; fatigue; heat sinks; packaging; power electronics; solders; temperature measurement; thermal resistance measurement; case-above-ambient temperature rise; condition monitoring; converter electrical loading; dynamic thermal model; heat sink; internal thermal resistance estimation; packaging-related solder fatigue; power electronic module failure; power electronic system; power module; solder fatigue monitoring; temperature measurement; Power semiconductor devices; Temperature measurement; Temperature sensors; Thermal resistance; Condition monitoring; losses; power semiconductor devices; reliability; solder fatigue; thermal network;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2011.2168556
  • Filename
    6022780