Title :
Capacitances in double-barrier tunneling structures
Author :
Genoe, Jan ; Van Hoof, Chris ; Van Roy, Willem ; Smet, Jurgen H. ; Fobelets, Kristel ; Mertens, Robert P. ; Borghs, Gustaaf
Author_Institution :
Interuniv. Micro-Electron. Center, Leuven, Belgium
fDate :
9/1/1991 12:00:00 AM
Abstract :
Capacitances in a double-barrier tunneling structure are calculated for the specific sequential electron tunneling regime. Starting from Luryi´s (1988) definition of quantum capacitance, the authors model the charge accumulation in the well during the tunneling process using the Fermi-Dirac distribution. Analytical formulas for the total capacitance and conductance are derived. A complete small-signal model is proposed that demonstrates the external capacitance and conductance of the structure and its frequency behavior. The authors show both theoretically and experimentally that the capacitance in a tunneling structure is both bias- and frequency-dependent
Keywords :
capacitance; resonant tunnelling devices; semiconductor device models; tunnel diodes; Fermi-Dirac distribution; bias dependence; charge accumulation; conductance; double-barrier tunneling structures; frequency behavior; quantum capacitance; resonant tunnelling diode; small-signal model; specific sequential electron tunneling regime; total capacitance; Detectors; Electron emission; Energy states; Frequency; Magnetic fields; Potential well; Quantum capacitance; Reservoirs; Tunneling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on