DocumentCode
1324629
Title
Direct extraction of the AlGaAs/GaAs heterojunction bipolar transistor small-signal equivalent circuit
Author
Costa, Damian ; Liu, William U. ; Harris, James S., Jr.
Author_Institution
Solid State Lab., Stanford Univ., CA, USA
Volume
38
Issue
9
fYear
1991
fDate
9/1/1991 12:00:00 AM
Firstpage
2018
Lastpage
2024
Abstract
The authors describe a novel, direct technique for determining the small-signal equivalent circuit of a heterojunction bipolar transistor (HBT). The parasitic elements are largely determined from measurements of test structures, reducing the number of elements determined from measurements of the transistor. The intrinsic circuit elements are evaluated from y -parameter data, which are DC-embedded from the known parasitics. The equivalent-circuit elements are uniquely determined at any frequency. The validity of this technique is confirmed by showing the frequency independence of the extracted circuit elements. The equivalent circuit models the HBT s -parameters over a wide range of collector currents. Throughout the entire 1-18-GHz frequency range, the computed s -parameters agree very well with the experimental data
Keywords
III-V semiconductors; S-parameters; aluminium compounds; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; semiconductor device testing; solid-state microwave devices; 1 to 18 GHz; AlGaAs-GaAs; HBT; S-parameters; equivalent-circuit elements; frequency independence; heterojunction bipolar transistor; intrinsic circuit elements; model; parasitic elements; small-signal equivalent circuit; test structures; Circuit testing; Electrical resistance measurement; Equivalent circuits; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Parasitic capacitance; Scattering parameters; Semiconductor process modeling; Solid state circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.83724
Filename
83724
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