• DocumentCode
    1324629
  • Title

    Direct extraction of the AlGaAs/GaAs heterojunction bipolar transistor small-signal equivalent circuit

  • Author

    Costa, Damian ; Liu, William U. ; Harris, James S., Jr.

  • Author_Institution
    Solid State Lab., Stanford Univ., CA, USA
  • Volume
    38
  • Issue
    9
  • fYear
    1991
  • fDate
    9/1/1991 12:00:00 AM
  • Firstpage
    2018
  • Lastpage
    2024
  • Abstract
    The authors describe a novel, direct technique for determining the small-signal equivalent circuit of a heterojunction bipolar transistor (HBT). The parasitic elements are largely determined from measurements of test structures, reducing the number of elements determined from measurements of the transistor. The intrinsic circuit elements are evaluated from y-parameter data, which are DC-embedded from the known parasitics. The equivalent-circuit elements are uniquely determined at any frequency. The validity of this technique is confirmed by showing the frequency independence of the extracted circuit elements. The equivalent circuit models the HBT s-parameters over a wide range of collector currents. Throughout the entire 1-18-GHz frequency range, the computed s-parameters agree very well with the experimental data
  • Keywords
    III-V semiconductors; S-parameters; aluminium compounds; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; semiconductor device testing; solid-state microwave devices; 1 to 18 GHz; AlGaAs-GaAs; HBT; S-parameters; equivalent-circuit elements; frequency independence; heterojunction bipolar transistor; intrinsic circuit elements; model; parasitic elements; small-signal equivalent circuit; test structures; Circuit testing; Electrical resistance measurement; Equivalent circuits; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Parasitic capacitance; Scattering parameters; Semiconductor process modeling; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.83724
  • Filename
    83724