DocumentCode
1324751
Title
Optimum base doping profile for minimum base transit time
Author
Suzuki, Kunihiro
Author_Institution
Fujitsu Labs. Ltd., Atsugi, Japan
Volume
38
Issue
9
fYear
1991
fDate
9/1/1991 12:00:00 AM
Firstpage
2128
Lastpage
2133
Abstract
The author investigates the base doping profile which gives the minimum base transit time. The peak base concentration is selected so that the base resistance is the same at any base width for all profiles: box, Gaussian, and exponential. The exponential profile always gives the minimum base transit time at any base width. Thus this profile is the best if there is no other base-concentration-limiting factor, which is the case for heterojunction-bipolar transistors. The shallowest base width was achieved with the box profile, and the base transit time at this base width is smaller than that of other profiles at each profile´s allowable base width. Consequently, for homojunction transistors, the optimum base doping profile changes from exponential to Gaussian and from Gaussian to box as the base width decreases. The author also investigated the base transit time of epitaxial base transistors with a 50-nm base width and found that the base transit time increases by a factor of 1.5 when the peak base concentration is located at a depth of 20 nm
Keywords
bipolar transistors; doping profiles; Gaussian profile; HBT; base doping profile; base resistance; base width; box profile; epitaxial base transistors; exponential profile; heterojunction-bipolar transistors; homojunction transistors; minimum base transit time; peak base concentration; Bipolar transistors; Current density; Doping profiles; Electron mobility; Equations; Helium; Heterojunctions; Photonic band gap; Tunneling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.83740
Filename
83740
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