Title :
A multichannel digital demodulator for LVDT/RVDT position sensors
Author :
Yassa, Fathy F. ; Garverick, Steven L.
Author_Institution :
General Electric Co., Schenectady, NY, USA
fDate :
4/1/1990 12:00:00 AM
Abstract :
The architecture, VLSI implementation, and test results for a mixed analog and digital multichannel demodulator used with linear/rotary-variable-differential-transformer (LVDT/RVDT) position sensors are presented. The monolithic multichannel demodulator has four regular demodulation channels and a fifth channel for system tests. Each channel has a first-order Σ-Δ analog-to-digital converter implemented in switched-capacitor circuits, and a dedicated digital demodulator with a 32-b word length. The outputs of the analog-to-digital converters are digitally demodulated, down-sampled, and filtered. The digital demodulator uses an adaptive AM demodulation algorithm based on prediction techniques. Simulation of the digital circuitry as well as a placement and routing of the mixed signal circuitry was done using a bit-serial compiler. The design was fabricated in a 1.2-μm p-well bulk CMOS process and contains 83000 transistors in a die size of 325×330 mil2. Test results show that absolute accuracies of ±0.2% of full scale are achieved without calibration
Keywords :
CMOS integrated circuits; VLSI; analogue-digital conversion; demodulators; electric sensing devices; position measurement; switched capacitor networks; Σ-Δ analog-to-digital converter; 1.2 micron; 32 bit; 325 mil; 330 mil; CMOS; LVDT position sensors; RVDT position sensors; adaptive AM demodulation algorithm; channel for system tests; dedicated digital demodulator; die size; digital demodulator; down-sampled; filtered; mixed signal circuitry; monolithic multichannel demodulator; multichannel digital demodulator; prediction techniques; regular demodulation channels; signal conditioning circuits; switched-capacitor circuits; word length; Analog-digital conversion; Circuit simulation; Circuit testing; Demodulation; Digital filters; Prediction algorithms; Routing; Switched capacitor circuits; System testing; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of