Title :
White-Light Electroluminescence From n-ZnO/p-GaN Heterojunction Light-Emitting Diodes at Reverse Breakdown Bias
Author :
Chen, H.C. ; Chen, M.J. ; Huang, Y.H. ; Sun, W.C. ; Li, W.C. ; Yang, J.R. ; Kuan, H. ; Shiojiri, M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
White-light electroluminescence (EL) from n-type ZnO (n-ZnO)/p-type GaN (p-GaN) heterojunction light-emitting diodes operated at reverse breakdown bias was reported. The n-ZnO epilayers were grown by atomic layer deposition on p-GaN. The electron tunneling from the deep-level states near the ZnO/GaN interface to the conduction band in n-ZnO is responsible for the reverse breakdown. The EL spectrum was composed of the blue light at 450 nm and the broadband around 550 nm, which originated from the Mg acceptor levels in p-GaN and the deep-level states near the ZnO/GaN interface, respectively. The chromaticity coordinate of the EL spectrum was (0.31, 0.36), which is very close to (0.33, 0.33) of the standard white light.
Keywords :
II-VI semiconductors; III-V semiconductors; atomic layer deposition; electroluminescence; gallium compounds; light emitting diodes; p-n heterojunctions; semiconductor device breakdown; tunnelling; wide band gap semiconductors; zinc compounds; EL spectrum; LED; ZnO-GaN; acceptor level; atomic layer deposition; blue light; chromaticity coordinate; conduction band; deep-level states; electron tunneling; epilayers; gallium nitride; n-p heterojunction light emitting diode; reverse breakdown bias; white light electroluminescence; zinc oxide; Electric breakdown; Gallium nitride; Heterojunctions; Laser excitation; Light emitting diodes; Tunneling; Zinc oxide; Atomic layer deposition (ALD); gallium nitride; heterojunction; white-light-emitting diode (LED); zinc oxide;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2164408