• DocumentCode
    1325494
  • Title

    Suppression of Current Shot Noise and of Spontaneous Radiation Emission in Electron Beams by Collective Coulomb Interaction

  • Author

    Dyunin, E. ; Nause, A. ; Gover, A.

  • Author_Institution
    Dept. of Phys. Electron., Tel Aviv Univ., Tel Aviv, Israel
  • Volume
    39
  • Issue
    10
  • fYear
    2011
  • Firstpage
    2033
  • Lastpage
    2038
  • Abstract
    The effect of current-shot-noise suppression in an electron beam (e-beam) and the corresponding process of charged-particle self-ordering are analyzed using an analytic 1-D model and verified by 3-D numerical simulations. The suppression of current shot noise can be utilized to enhance the coherence of seeded free-electron lasers (FELs) and any other radiation devices using an e-beam. It is shown that this can be attained at optical frequencies with state-of-the-art high-quality e-beams. Our analysis of spontaneous emission suppression results in fundamental theoretical limit expressions for the coherence of FELs and other coherent radiation devices, which is analogous to the Schawlow-Townes limit. After exceeding the shot-noise limit, the coherence of FEL radiation is limited in the IR by velocity noise due to the e-beam energy spread. At UV and shorter wavelengths, it is fundamentally limited by quantum noise.
  • Keywords
    free electron lasers; numerical analysis; plasma light propagation; plasma simulation; plasma transport processes; shot noise; spontaneous emission; 1D model; 3D numerical simulation; IR radiation effect; Schawlow-Townes limit; UV radiation effect; charged-particle self-ordering; collective coulomb interaction; current shot noise suppression; electron beams; optical frequency; seeded free-electron lasers; spontaneous emission; spontaneous radiation emission; state-of-the-art high-quality e-beams; Free electron lasers; Kinetic theory; Laser beams; Laser noise; Particle beams; Undulators; Bunched particle beams; electron beams (e-beams); free-electron lasers (FELs); particle beam dynamics; shot noise;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2162853
  • Filename
    6024476