• DocumentCode
    1325615
  • Title

    The Prediction and Measurement of System Availability: A Bayesian Treatment

  • Author

    Brender, David M.

  • Author_Institution
    Independent consultant with offices in New York, N. Y.
  • Issue
    3
  • fYear
    1968
  • Firstpage
    127
  • Lastpage
    138
  • Abstract
    For any physical system there is always some degree of uncertainty regarding the values of the parameters governing the performance of that system. Uncertainties in the values of the failure rate ¿ and the repair rate ß reflect themselves in an uncertainty in the value of the point availability, A = ß/(ß + ¿). Treating these uncertain parameters as random variables, exact expressions for the mean, variance, and distribution of the point availability are derived by combining the distributions of the failure and repair rates. Hence we can construct estimates and confidence statements for the availability which are consistent with the equivalent statements on the failure-rate and repair-rate parameters. Exact mean and variance results are also provided for mission, transient, and other time-dependent availability expressions. The acquisition of failure and repair data introduces additional information as well as additional uncertainties. A Bayes transformation is developed which utilizes the two data sets to readily convert prior estimates and confidence statements on the availability into posterior versions. This particular paper is restricted to a basic model involving an alternating sequence of independent exponentially distributed operational and repair intervals with the respective rate parameters described by distinct gamma distributions. For this model the point availability proves to have an Euler distribution.
  • Keywords
    Availability; Bayesian methods; Gain measurement; Random variables; State estimation; Statistical distributions; Steady-state; System testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1968.5216926
  • Filename
    5216926