Title :
Microwave measurement of temperature and current dependences of surface impedance for high-Tc superconductors
Author :
Kobayashi, Yoshio ; Imai, Tadashi ; Kayano, Hiroyuki
Author_Institution :
Dept. of Electr. Eng., Saitama Univ., Japan
fDate :
9/1/1991 12:00:00 AM
Abstract :
Perturbation formulas for TE011-mode dielectric rod resonator and for a TE011-mode circular cavity resonator are derived to determine the surface impedance Zs of superconductors from measured values of resonant frequencies and unloaded Q. The relation between the maximum surface current density of a superconductor, Js, and output power from a signal generator is derived. On the basis of these analytical results, a measurement technique is proposed to evaluate the temperature and Js dependencies of Zs for superconductors. The measured results of the temperature dependence of Zs for YBCO and copper plates are presented. From these results, it is verified that the dielectric resonator is suitable for measuring the surface reactance for YBCO. From these Zs values the temperature dependences of the skin depth and the penetration depth and those of the complex conductivity are obtained on the basis of the two-fluid model. These measured values agree well with the theoretical curves
Keywords :
barium compounds; cavity resonators; dielectric resonators; high-temperature superconductors; microwave measurement; superconducting devices; waveguide theory; yttrium compounds; YBaCuO; circular cavity resonator; complex conductivity; current dependences; dielectric rod resonator; high temperature superconductors; high-Tc superconductors; maximum surface current density; penetration depth; resonant frequencies; skin depth; surface impedance; temperature dependences; two-fluid model; unloaded Q; Cavity resonators; Current measurement; Dielectric measurements; Microwave measurements; Superconductivity; Surface impedance; Tellurium; Temperature dependence; Temperature measurement; Yttrium barium copper oxide;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on