DocumentCode
1325668
Title
Performance-driven routing with multiple sources
Author
Cong, Jason ; Madden, Patrick H.
Author_Institution
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
Volume
16
Issue
4
fYear
1997
fDate
4/1/1997 12:00:00 AM
Firstpage
410
Lastpage
419
Abstract
Existing routing problems for delay minimization consider the connection of a single source node to a number of sink nodes, with the objective of minimizing the delay from the source to all sinks, or a set of critical sinks. In this paper, we study the problem of routing nets with multiple sources, such as those found in signal busses. This new model assumes that each node in a net may be a source, a sink, or both. The objective is to optimize the routing topology to minimize the total weighted delay between all node pairs (of a subset of critical node pairs). We present a heuristic algorithm for the multiple-source performance driven routing tree problem based on efficient construction of minimum diameter minimum-cost Steiner trees. Experimental results on random nets with submicrometer CMOS IC and MCM technologies show an average of 12.6% and 21% reduction in the maximum interconnect delay, when compared with conventional minimum Steiner tree based topologies. Experimental results on multisource nets extracted from an Intel processor show as much as a 16.1% reduction in the maximum interconnect delay, when compared with conventional minimum Steiner tree based topologies
Keywords
CMOS integrated circuits; circuit optimisation; integrated circuit layout; multichip modules; network routing; network topology; trees (mathematics); CMOS IC; Intel processor; MCM; delay minimization; heuristic algorithm; interconnect topology optimization; minimum-diameter minimum-cost Steiner tree; multiple sources; performance-driven network routing; signal bus; sink nodes; submicrometer technology; CMOS integrated circuits; CMOS technology; Delay effects; Driver circuits; Heuristic algorithms; Integrated circuit interconnections; Routing; Topology; Very large scale integration; Wire;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.602477
Filename
602477
Link To Document