Title :
Behaviour of fully ionized seed plasma excited by microwave
Author :
Murakami, Tomoyuki ; Suekane, Tetsuya ; Okuno, Yoshihiro ; Kabashima, Shigeharu
Author_Institution :
Dept. of Energy Sci., Tokyo Inst. of Technol., Yokohama, Japan
fDate :
2/1/1997 12:00:00 AM
Abstract :
Nonequilibrium plasmas with cesium metal vapor ionization in helium and argon gases at moderate pressures are excited with microwave power. The structures and behaviour of the seeded plasmas are experimentally examined, particularly under the condition of Full seed (cesium atoms) ionization. By cesium seeding, the minimum power sustaining the plasma is reduced markedly, and both a broad plasma observed in pure helium and unsteady filament-like plasmas in pure argon change to the steady and broad plasma locating close to the inner surface of a discharge tube, it is revealed from the electron temperature measurements that the plasma can be in the regime of full seed ionization for suitable microwave powers, where the electron density is kept almost constant. The thickness of the fully ionized seed (FIS) plasma decreases with increasing the mole fraction of cesium vapor, and is almost independent of noble gas pressure. The thickness almost coincides with the skin depth determined from the electrical conductivity almost uniform in the FIS plasma. These facts suggest that the FIS plasma will be easily produced and maintained as long as the microwave power is consumed to the electron heating
Keywords :
argon; caesium; filamentation instability; helium; ionisation; plasma radiofrequency heating; plasma temperature; Cs-Ar; Cs-He; argon; broad plasma; cesium metal vapor ionization; electrical conductivity; electron heating; electron temperature measurements; fully ionized seed plasma; helium; microwave power; mole fraction; nonequilibrium plasmas; unsteady filament-like plasmas; Argon; Electromagnetic heating; Electrons; Gases; Helium; Ionization; Plasma density; Plasma measurements; Plasma temperature; Surface discharges;
Journal_Title :
Plasma Science, IEEE Transactions on