Title :
Static analysis of microstrip discontinuities using the excess charge density in the spectral domain
Author :
Martel, Jesus ; Boix, Rafael R. ; Horno, Manuel
Author_Institution :
Dept. of Electron. & Electromagn., Seville Univ., Spain
fDate :
9/1/1991 12:00:00 AM
Abstract :
Galerkin´s method in the spectral domain is applied to solve for the excess charge density existing on the strips of open-end and symmetric gap discontinuities in multilayered anisotropic substrates. The excess charge density is used to determine the capacitance components of the equivalent circuits, of these discontinuities. Numerical results are provided and a comparison with previous results is carried out
Keywords :
equivalent circuits; strip lines; waveguide theory; Galerkin´s method; capacitance components; equivalent circuits; excess charge density; microstrip discontinuities; multilayered anisotropic substrates; spectral domain; Anisotropic magnetoresistance; Capacitance; Coupling circuits; Dielectric materials; Equivalent circuits; Frequency; Microstrip; Optical losses; Scattering parameters; Strips;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
