• DocumentCode
    13259
  • Title

    Compact Model of Subvolume MTJ and Its Design Application at Nanoscale Technology Nodes

  • Author

    Yue Zhang ; Bonan Yan ; Wang Kang ; Yuanqing Cheng ; Klein, Jacques-Olivier ; Youguang Zhang ; Yiran Chen ; Weisheng Zhao

  • Author_Institution
    Beihang Spintronics Interdiscipl. Center, Beihang Univ., Beijing, China
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    2048
  • Lastpage
    2055
  • Abstract
    The current-induced perpendicular magnetic anisotropy magnetic tunnel junctions (p-MTJs) offer a number of advantages, such as high density and high speed. As p-MTJs downscale to ~40 nm, further performance enhancements can be realized thanks to high spin-torque efficiency, i.e., lower critical current density and higher thermal stability. In this paper, we investigate the origin of high spin-torque efficiency and give a phenomenological theory to describe the critical current reduction due to the subvolume activation. Based on various physical theories and structural parameters, a compact model of nanoscale MTJ is developed and demonstrates a satisfactory agreement with experimental results. Dynamic, static, and stochastic switching behaviors have been addressed and validated. Then, we perform mixed simulations for hybrid MTJ/CMOS read/write circuits, magnetic random access memory, and magnetic flip-flop to evaluate their performance. Analyses of energy consumption are given to show the prospect of MTJ technology node miniaturization.
  • Keywords
    CMOS integrated circuits; critical current density (superconductivity); magnetic storage; magnetic tunnelling; perpendicular magnetic anisotropy; random-access storage; thermal stability; critical current density; current-induced perpendicular magnetic anisotropy magnetic tunnel junctions; energy consumption; high spin-torque efficiency; hybrid MTJ CMOS read write circuits; magnetic flip-flop; magnetic random access memory; nanoscale technology nodes; subvolume MTJ; subvolume activation; thermal stability; Critical current density (superconductivity); Integrated circuit modeling; Magnetic tunneling; Semiconductor device modeling; Stability analysis; Switches; Thermal stability; Compact model; hybrid integrated circuit; magnetic tunnel junction (MTJ); spin-torque efficiency; spin-torque efficiency.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2414721
  • Filename
    7078914