• DocumentCode
    1325998
  • Title

    Deflection and maximum load of microfiltration membrane sieves made with silicon micromachining

  • Author

    van Rijn, Cees ; van der Wekken, Michiel ; Nijdam, Wietze ; Elwenspoek, Miko

  • Author_Institution
    Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands
  • Volume
    6
  • Issue
    1
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    48
  • Lastpage
    54
  • Abstract
    With the use of silicon micromachining, an inorganic membrane sieve for microfiltration has been constructed having a silicon nitride membrane layer with thickness typically 1 μm and perforations typically between 0.5 μm and 10 μm in diameter. As a support a ⟨100⟩-silicon wafer with openings of 1000 μm in diameter has been used. The thin silicon nitride layer is deposited on an initially dense support by means of a suitable chemical vapor deposition method (LPCVD). Perforations in the membrane layer are obtained with use of standard photo lithography and reactive ion etching (RIE). The deflection and maximum load of the membrane sieves are calculated in a first approximation. Experiments to measure the maximum load of silicon-rich silicon nitride membranes have confirmed this approximation
  • Keywords
    filtration; membranes; micromachining; silicon; LPCVD; Si; SiN; chemical vapor deposition; deflection; inorganic membrane sieve; maximum load; microfiltration; micromachining; perforation; photolithography; reactive ion etching; silicon nitride layer; silicon wafer; Biomembranes; Chemical vapor deposition; Filters; Filtration; Lacquers; Lithography; Microfiltration; Micromachining; Silicon; Temperature;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.557530
  • Filename
    557530