DocumentCode
1325998
Title
Deflection and maximum load of microfiltration membrane sieves made with silicon micromachining
Author
van Rijn, Cees ; van der Wekken, Michiel ; Nijdam, Wietze ; Elwenspoek, Miko
Author_Institution
Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands
Volume
6
Issue
1
fYear
1997
fDate
3/1/1997 12:00:00 AM
Firstpage
48
Lastpage
54
Abstract
With the use of silicon micromachining, an inorganic membrane sieve for microfiltration has been constructed having a silicon nitride membrane layer with thickness typically 1 μm and perforations typically between 0.5 μm and 10 μm in diameter. As a support a ⟨100⟩-silicon wafer with openings of 1000 μm in diameter has been used. The thin silicon nitride layer is deposited on an initially dense support by means of a suitable chemical vapor deposition method (LPCVD). Perforations in the membrane layer are obtained with use of standard photo lithography and reactive ion etching (RIE). The deflection and maximum load of the membrane sieves are calculated in a first approximation. Experiments to measure the maximum load of silicon-rich silicon nitride membranes have confirmed this approximation
Keywords
filtration; membranes; micromachining; silicon; LPCVD; Si; SiN; chemical vapor deposition; deflection; inorganic membrane sieve; maximum load; microfiltration; micromachining; perforation; photolithography; reactive ion etching; silicon nitride layer; silicon wafer; Biomembranes; Chemical vapor deposition; Filters; Filtration; Lacquers; Lithography; Microfiltration; Micromachining; Silicon; Temperature;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/84.557530
Filename
557530
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