• DocumentCode
    1326002
  • Title

    Design of ESD protection device using body floating technique in 65 nm CMOS process

  • Author

    Won, J.-I. ; Jung, Jin-Woo ; Yang, I.-S. ; Koo, Y.-S.

  • Author_Institution
    Dept. of Electron. Eng., Seokyeong Univ., Seoul, South Korea
  • Volume
    47
  • Issue
    19
  • fYear
    2011
  • Firstpage
    1072
  • Lastpage
    1073
  • Abstract
    A floating body electrostatic discharge (ESD) protection circuit positioned between and coupled to an I/O pad and an internal circuit is presented. A small NMOS transistor is used to control the body of a main NMOS transistor. When the small NMOS transistor is triggered, the body of the main NMOS transistor remains grounded. If the small NMOS transistor has not been triggered, the body of the main NMOS transistor remains in a floating state, lowering the range of the snapback voltage. As a consequence the ESD protection circuit is able to function more rapidly. The proposed ESD protection circuit is designed in 65 nm CMOS technology.
  • Keywords
    CMOS integrated circuits; MOSFET; electrostatic discharge; CMOS process; ESD protection device design; I/O pad; body floating technique; floating body electrostatic discharge protection circuit; size 65 nm; small NMOS transistor; snapback voltage;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2011.2186
  • Filename
    6025139