DocumentCode
1326002
Title
Design of ESD protection device using body floating technique in 65 nm CMOS process
Author
Won, J.-I. ; Jung, Jin-Woo ; Yang, I.-S. ; Koo, Y.-S.
Author_Institution
Dept. of Electron. Eng., Seokyeong Univ., Seoul, South Korea
Volume
47
Issue
19
fYear
2011
Firstpage
1072
Lastpage
1073
Abstract
A floating body electrostatic discharge (ESD) protection circuit positioned between and coupled to an I/O pad and an internal circuit is presented. A small NMOS transistor is used to control the body of a main NMOS transistor. When the small NMOS transistor is triggered, the body of the main NMOS transistor remains grounded. If the small NMOS transistor has not been triggered, the body of the main NMOS transistor remains in a floating state, lowering the range of the snapback voltage. As a consequence the ESD protection circuit is able to function more rapidly. The proposed ESD protection circuit is designed in 65 nm CMOS technology.
Keywords
CMOS integrated circuits; MOSFET; electrostatic discharge; CMOS process; ESD protection device design; I/O pad; body floating technique; floating body electrostatic discharge protection circuit; size 65 nm; small NMOS transistor; snapback voltage;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2011.2186
Filename
6025139
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