Title :
Adaptive Backstepping Sliding Mode
Control of Static Var Compensator
Author :
Sun, Li-Ying ; Tong, Shaocheng ; Liu, Yi
Author_Institution :
Electr. Eng. Coll., Liaoning Univ. of Technol., Jinzhou, China
Abstract :
The robust H∞ control problem is addressed for a single machine infinite bus system with static var compensator (SVC), the damping coefficient uncertainty and external disturbances in this paper. Storage functions of the control system are constructed based on modified adaptive backstepping sliding mode control and Lyapunov methods. A nonlinear robust H∞ controller and a parameter updating law are obtained simultaneously. The controller cannot only attenuate the influences of external disturbances on the system output, but also has strong robustness for system parameters variations. Since the controller design is based completely on the nonlinear dynamic system without any linearization, the nonlinear property of the dynamic system is well preserved. The simulation results show that more rapid speed response and stronger robustness can be obtained by the proposed method than the conventional adaptive backstepping and adaptive backstepping sliding mode control methods.
Keywords :
H∞ control; Lyapunov methods; adaptive control; control system synthesis; damping; nonlinear control systems; nonlinear dynamical systems; power system control; robust control; static VAr compensators; uncertain systems; variable structure systems; Lyapunov method; adaptive backstepping sliding mode H∞ control; controller design; conventional adaptive backstepping; damping coefficient uncertainty; external disturbance; nonlinear dynamic system; rapid speed response; single machine infinite bus system; static var compensator; system parameters variation; Backstepping; H infinity control; Power system dynamics; Sliding mode control; Static VAr compensators; Uncertain systems; $H_{infty} $ control; Adaptive backstepping; parameter uncertainty; sliding mode control; static var compensator;
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2010.2066975