Title :
Return-limited inductances: a practical approach to on-chip inductance extraction
Author :
Shepard, Kenneth L. ; Tian, Zhong
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
fDate :
4/1/2000 12:00:00 AM
Abstract :
Decreasing slew rates and efforts to reduce the resistance-capacitance (RC) delays of on-chip interconnect through design and technology have resulted in the growing importance of inductance in analyzing interconnect response for timing and noise analysis. In this paper, we consider a practical approach for extracting approximate inductances of on-chip interconnect. This approach, which we call the method of return-limited inductances, is based on performing the inductance modeling of signal lines and power-ground lines independently and on taking advantage of the power and ground distribution of the chip to localize inductive coupling. A set of simple geometry-based matrix decomposition rules guide sparsification in these extractions
Keywords :
inductance; integrated circuit interconnections; integrated circuit modelling; matrix decomposition; sparse matrices; integrated circuit interconnect; noise analysis; on-chip inductance; parameter extraction; power ground line; resistance-capacitance delay; return-limited inductance; signal line; slew rate; sparse matrix decomposition; timing analysis; Capacitance; Circuit noise; Copper; Coupling circuits; Delay; Inductance; Integrated circuit interconnections; Switching circuits; Timing; Wires;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on