Bridge fault diagnosis using stuck-at fault simulation

Author

Wu, Jue ; Rudnick, Elizabeth M.

Author_Institution

Sun Microsyst., Menlo Park, CA, USA

Volume

19

Issue

4

fYear

2000

fDate

4/1/2000 12:00:00 AM

Firstpage

489

Lastpage

495

Abstract

A new diagnostic fault simulator is described that diagnoses both feedback and nonfeedback bridge faults in combinational circuits while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals problem. Sets representing nodes possibly involved in a defect are partitioned based on logic and fault simulation of failing vectors. The approach has been demonstrated for two-line bridge faults on several large combinational benchmark circuits containing Boolean primitives and has achieved over 98% accuracy for nonfeedback bridge faults and over 85% accuracy for feedback bridge faults with good diagnostic resolution

Keywords

VLSI; circuit feedback; combinational circuits; fault diagnosis; fault simulation; integrated circuit testing; logic testing; Byzantine Generals problem; benchmark circuits; bridge fault diagnosis; combinational circuits; diagnostic resolution; failing vectors; feedback bridge faults; nonfeedback bridge faults; stuck-at fault simulation; two-line bridge faults; Analytical models; Bridge circuits; Circuit faults; Circuit simulation; Combinational circuits; Dictionaries; Failure analysis; Fault diagnosis; Feedback circuits; Logic testing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.838998

Filename

838998