Title :
An Approach to Single Event Testing of SDRAMs
Author :
Adell, Philippe C. ; Edmonds, Larry ; McPeak, Richard ; Scheick, Leif ; McClure, Steve S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A unique testing approach based on error-pattern identification with a graphical mapping and color-coding of the full SDRAM memory during single-event characterization is proposed. Results about unique SEFI modes and the role of temperature are discussed.
Keywords :
DRAM chips; integrated circuit testing; SEFI modes; color-coding; error-pattern identification; full SDRAM memory; graphical mapping; single event testing; single-event characterization; Radiation effects; Registers; SDRAM; Temperature dependence; Temperature distribution; Temperature measurement; Testing; Micro-displacement; SDRAMs; single event effects; stuck bits;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2059711
