DocumentCode :
1326375
Title :
Bayes-optimality motivated linear and multilayered perceptron-based dimensionality reduction
Author :
Lotlikar, Rohit ; Kothari, Ravi
Author_Institution :
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
Volume :
11
Issue :
2
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
452
Lastpage :
463
Abstract :
Dimensionality reduction is the process of mapping high-dimension patterns to a lower dimension subspace. When done prior to classification, estimates obtained in the lower dimension subspace are more reliable. For some classifiers, there is also an improvement in performance due to the removal of the diluting effect of redundant information. A majority of the present approaches to dimensionality reduction are based on scatter matrices or other statistics of the data which do not directly correlate to classification accuracy. The optimality criteria of choice for the purposes of classification is the Bayes error. Usually however, Bayes error is difficult to express analytically. We propose an optimality criteria based on an approximation of the Bayes error and use it to formulate a linear and a nonlinear method of dimensionality reduction. The nonlinear method we propose, relies on using a multilayered perceptron which produces as output the lower dimensional representation. It thus differs from autoassociative like multilayered perceptrons which have been proposed and used for dimensionality reduction. Our results show that the nonlinear method is, as anticipated, superior to the linear method in that it can perform unfolding of a nonlinear manifold. In addition, the nonlinear method we propose provides substantially better lower dimension representation (for classification purposes) than Fisher´s linear discriminant (FLD) and two other nonlinear methods of dimensionality reduction that are often used
Keywords :
Bayes methods; multilayer perceptrons; optimisation; pattern classification; Bayes error; Bayes-optimality motivated linear dimensionality reduction; multilayered perceptron-based dimensionality reduction; nonlinear manifold unfolding; nonlinear method; optimality criteria; redundant information removal; Computer science; Data visualization; Error analysis; Multi-layer neural network; Multilayer perceptrons; Neural networks; Pattern recognition; Scattering; Statistics; Topology;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/72.839014
Filename :
839014
Link To Document :
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