Title :
Guaranteed Passive Parameterized Model Order Reduction of the Partial Element Equivalent Circuit (PEEC) Method
Author :
Ferranti, Francesco ; Antonini, Giulio ; Dhaene, Tom ; Knockaert, Luc
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
Abstract :
The decrease of IC feature size and the increase of operating frequencies require 3-D electromagnetic methods, such as the partial element equivalent circuit (PEEC) method, for the analysis and design of high-speed circuits. Very large systems of equations are often produced by 3-D electromagnetic methods. During the circuit synthesis of large-scale digital or analog applications, it is important to predict the response of the system under study as a function of design parameters, such as geometrical and substrate features, in addition to frequency (or time). Parameterized model order reduction (PMOR) methods become necessary to reduce large systems of equations with respect to frequency and other design parameters. We propose an innovative PMOR technique applicable to PEEC analysis, which combines traditional passivity-preserving model order reduction methods and positive interpolation schemes. It is able to provide parametric reduced-order models, stable, and passive by construction over a user-defined range of design parameter values. Numerical examples validate the proposed approach.
Keywords :
equivalent circuits; high-speed integrated circuits; interpolation; reduced order systems; 3D electromagnetic methods; circuit synthesis; guaranteed passive parameterized model order reduction; innovative PMOR technique; partial element equivalent circuit; passivity-preserving model order reduction methods; positive interpolation schemes; Computational modeling; Integrated circuit modeling; Interpolation; Parametric statistics; RLC circuits; Reduced order systems; Interpolation; parameterized model order reduction (PMOR); partial element equivalent circuit method (PEEC); passivity;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2010.2051949