Title :
A 30-W flyback converter operating at 5 MHz
Author :
Zhemin Zhang ; Ngo, Khai D. T. ; Nilles, Jeff L.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
Motivated by the recent commercialization of gallium-nitride (GaN) switches, an effort was initiated to determine whether it was feasible to switch the flyback converter at 5 MHz in order to improve the power density of this versatile isolated topology. Leakage inductance, harmonic losses in the coupled windings, core loss, layout impedances, gate drivers, and other issues problematic at high frequency were quantified by analysis and simulation for a bus converter stepping 36-72 V down to 12 V at 0-30 W. The layout of the coupled windings was optimized by finite-element simulation to achieve 30 nH of leakage inductance with respect to 0.96 μH of magnetizing inductance in order to limit voltage stress. Even with optimal layout, the windings consumed almost 3% of the output power, and dominated the total loss. After breaking down the copper losses in frequency domain, harmonic analysis revealed that 38% of the winding losses were consumed by the harmonics. In order to validate all analysis, a quasi-square-wave (QSW) flyback converter with zero-voltage switching (ZVS) was measured with peak efficiency of 87%. The coupled inductors were composed of a commercial planar ER core fabricated from nickel-zinc ferrite; the size was measured as 18×3.2×10 mm3 and occupied 30% volume of the power stage. In addition, the high dv/dt of 16 V/ns and high di/dt of 10 A/ns caused by the smaller output capacitance of GaN FETs necessitated negative 2 V between gate and source to prevent false turn-on of the switches.
Keywords :
III-V semiconductors; finite element analysis; gallium compounds; switching convertors; wide band gap semiconductors; windings; zero voltage switching; GaN; GaN FETs; ZVS; bus converter; copper losses; core loss; coupled winding layout; finite-element simulation; flyback converter; frequency 5 MHz; frequency domain analysis; gallium-nitride switches; gate drivers; harmonic analysis; harmonic losses; layout impedances; leakage inductance; nickel-zinc ferrite; planar ER core; power 30 W; quasisquare-wave converter; size 10 mm; size 18 mm; size 3.2 mm; voltage 12 V; voltage 2 V; voltage 36 V to 72 V; voltage stress; zero-voltage switching; Core loss; Field effect transistors; Harmonic analysis; Inductance; Inductors; Windings; Zero voltage switching;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
Conference_Location :
Fort Worth, TX
DOI :
10.1109/APEC.2014.6803492