Title :
Development of temperature-stable thick-film dielectrics. III. Role of glass on the microstructure evolution of a thick-film dielectric
Author :
Chiou, Bi-Shiou ; Liu, K.C. ; Duh, Jenq-Gong ; Chung, M.C.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
9/1/1991 12:00:00 AM
Abstract :
For pt.I see ibid., vol.12, p.798-808 (1989). Glass phase plays an important role in the characteristics of thick-film microelectronics. A dielectric system in BaTiO3 and SrTiO3 containing PbO, B2O3, SiO2, and Al2O 3 glass constituents is investigated. Microstructure evolution and phase distribution after thermal aging are studied with the aid of electron microscope and X-ray diffractometer. It is observed that the phases in 40 vol.% BaTiO3-25 vol.% SrTiO3-35 vol.% glass thick-film dielectric are not altered after 500°C aging for 480 h. The variation in surface morphology after aging is attributed to the precipitation of heavy metal component from the glass which acts as a diffusion species and then dissolves the crystalline phase during firing. The presence of glass in the dielectric enhances the formation of solid solution (BaxSr1-x)TiO3 and results in the broadening of the Curie peak
Keywords :
ageing; barium compounds; dielectric materials; environmental testing; glass; materials testing; strontium compounds; thick film circuits; BaTiO3-SrTiO3-PbO-B2O3 -SiO2-Al2O3; Curie peak broadening; X-ray diffractometer; characteristics; microstructure evolution; phase distribution; precipitation of heavy metal component; role of glass; solid solution formation; surface morphology; temperature-stable thick-film dielectrics; thermal aging; thick-film microelectronics; Aging; Crystallization; Dielectrics; Electron microscopy; Glass; Microelectronics; Microstructure; Solids; Surface morphology; X-ray diffraction;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
