• DocumentCode
    1327407
  • Title

    High-frequency power transformer model for circuit simulation

  • Author

    Dallago, Enrico ; Sassone, Gabriele ; Venchi, Giuseppe

  • Author_Institution
    Dept. of Electr. Eng., Pavia Univ., Italy
  • Volume
    12
  • Issue
    4
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    664
  • Lastpage
    670
  • Abstract
    A model for the circuit simulation of transformers used in high-frequency power processing is proposed. Many important transformer effects are combined in a single formulation. An Atherton-Jiles model with improved minor-loop handling ability is employed to simulate the hysteresis effect in the magnetic core. Eddy currents and skin and proximity effects are simulated by dynamically approximating the field and flux distributions in the entire structure. Leakage fluxes, capacitive couplings and the influence of temperature on electric and magnetic materials are also included. The parameters needed for simulation are magnetic material characteristics, available in data sheets, core geometry and winding geometry. The model was implemented (built) in the source code of SPICE3
  • Keywords
    SPICE; circuit analysis computing; eddy currents; high-frequency transformers; magnetic fields; magnetic flux; power engineering computing; power transformers; skin effect; software packages; transformer cores; Atherton-Jiles model; SPICE3 software; capacitive couplings; circuit simulation; computer simulation; eddy currents; high-frequency power transformer model; hysteresis effect; leakage flux distribution; magnetic core; magnetic field distribution; magnetic flux distribution; magnetic material characteristics; minor-loop handling ability; proximity effect; skin effect; temperature effects; Circuit simulation; Couplings; Eddy currents; Geometry; Magnetic cores; Magnetic hysteresis; Magnetic materials; Power transformers; Proximity effect; Skin;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/63.602561
  • Filename
    602561